📧 Subscribe to the EE Journal Daily Newsletter!

Category: Test/Measurement

Test/Measurement

  • Bill Godbout Perishes in Northern California’s Camp Fire

      People of a certain age, who mindfully lived through the early microcomputer revolution during the first half of the 1970s, know about Bill Godbout.…

  • Bashing Bugs on SoCs

    UltraSoC, the SOC debug company I wrote about a few weeks ago www.eejournal.com/archives/articles/20150728-ultrasoc/ is being pretty imaginative in their marketing. Today, they have launched a…

  • Requirements Modeling and Simulation

    So you’re working on a design… Are you sure you’re building what was intended? Yes, you’re building what they asked for… or, at least, what…

  • Audio-Grade Bits!

    If you store your music digitally — and don’t we all? — you want audio grade bits. Apparently bits aren’t just bits. An audiophile site…

  • Semiconductor CapEx to grow 5.6% in 2015

    Semiconductor, meet cycle. It’s another up/down go-around for semiconductor capital spending, according to the latest Gartner report that predicts that 2015 will be nearly flat…

  • MEMS Laser Probing

    I saw an announcement about a new MEMS diagnostic instrument, the M150 from Ardic. It uses a laser to measure the frequency response of a…

  • New Synopsys DFT Offerings

    It’s ITC time, and this is when many of the EDA and test folks roll out their new stuff. True to this pattern, Synopsys has…

  • Debug Trick Uses CPU Cache as RAM

    Embedded tool company Asset Intertech is giving away a free e-book that teaches a clever little debugging trick: Use your CPU’s on-chip cache like RAM…

  • The Challenges of Testing MEMS

    Last month saw this year’s edition of the MEMS Test and Reliability conference. And there are clearly numerous issues to be addressed. To be clear,…

  • 20-nm Test Enhancements

    ITC is usually the time when the EDA companies announce their coolest test-related advances. While Mentor announced their IJTAG support, Synopsys focused its agenda largely…