Archives: News
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Advantest Unveils T5801 Ultra-High-Speed Memory Test System to Power Next-Generation DRAM Devices
TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The…
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SEGGER J-Link debug probes and Flasher programming tools support ST’s Stellar P and G MCUs Monheim am Rhein, Germany—February 12, 2025
With multiple cores, Stellar devices enable developers to consolidate multiple electronic control units (ECUs) into one high-performance ECU using a single Stellar MCU. This approach…
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Nexperia releases automotive industry’s first 10BASE-T1S OPEN Alliance compliant ESD protection diodes
Nijmegen, February 11, 2025: Nexperia today released the industry’s first ESD protection diodes to comply with the OPEN Alliance requirements for use in 10BASE-T1S automotive…
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CEA-Leti Announces FAMES Pilot Line In Nature Reviews Electrical Engineering
GRENOBLE, FRANCE – Feb. 7, 2025 – The FAMES Pilot Line offers a complete set of technologies to develop innovative chip architectures. FAMES will open…
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Elma’s Robust 7-slot SOSA Aligned Backplane Equipped with VITA 62 PSU Slot
Technical Highlights 3U OpenVPX 6+1 backplane including VITA 62 PSU slot SOSA aligned to support defense industry interoperability initiatives Helps optimize SWaP and lower lifecycle…