Archives: News
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OneSpin Launches Industry’s First Comprehensive Solution For Automatic Metric-Driven Formal Assertion-Based Verification Coverage Analysis And Measurement
MUNICH, Germany, TOKYO, and SUNNYVALE, Calif. – May 23, 2011 – OneSpin Solutions, an EDA company that provides innovative formal assertion-based verification solutions, today announced…
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Cortus will be exhibiting their APS3 32 bit processor core at the Design Automation Conference 2011 (DAC), San Diego 6th-8th June
Montpellier, 23rd May 2011. Cortus S.A., the technology leader in ultra low power, silicon efficient 32-bit processor IP cores will be presenting their APS3 technology at…
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Rohde & Schwarz and Synopsys Form Strategic Collaboration for LTE/LTE-Advanced Design Acceleration
MUNICH and MOUNTAIN VIEW, Calif., May 23, 2011 /PRNewswire/ — Synopsys, Inc. (Nasdaq: SNPS), a world leader in software and IP for semiconductor design, verification…
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Pentek Brings Power of Cobalt Virtex-6 Family to CompactPCI System Designs
UPPER SADDLE RIVER, NJ–May 23, 2011–Pentek, Inc., today announced that its highly popular Cobalt® board family is now available for use in CompactPCI (cPCI) systems. The migration…
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Verific Unveils Perl Interface for its SystemVerilog, VHDL Front-End Solutions
ALAMEDA, CALIF. –– May 19, 2011 –– Verific Design Automation, long known for its SystemVerilog and VHDL front-end solutions used by leading EDA, FPGA and semiconductor companies worldwide, today…
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Carbon Design Systems Adds ARM Cortex-A15 Models to its IP Exchange Web Portal
ACTON, MASS. –– May 19, 2011 –– Carbon Design Systems™, the leading supplier of solutions for architectural analysis, performance optimization and pre-silicon firmware debug,announced today availability…
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Agilent Technologies Introduces Benchtop Source/Measure Units with Superior Performance, Wide Voltage/Current Ranges for Testing of Semiconductors, Components and Materials
SANTA CLARA, Calif., May 18, 2011 – Agilent Technologies Inc. (NYSE: A) today announced the B2900A Series, its first line of compact benchtop source/measure units for…