GateRocket Highlights New FPGA Debug Solutions at DVCon

·

·

Bedford, Mass. – Feb. 8, 2010 – GateRocket® Inc. will showcase its latest FPGA design and debug innovations at DVCon this month.

WHO:  GateRocket, supplier of advanced FPGA design and debug solutions for Xilinx and Altera programmable devices.

WHAT:  Exhibiting new, innovative technology to cut FPGA design and debug time by 50 percent or more. At the show, GateRocket will be taking the wraps of the latest innovations and improvements in Version 5.0 of its RocketVision debug and RocketDrive verification solutions.

WHEN:  Feb. 22-25, 2010, DVCon, DoubleTree Hotel, San Jose, Calif.

WHERE:  GateRocket will be demonstrating its products in DVCon Booth #802 – Attendees may sign up in advance for product demos at the show.

WHY:  The significant increase in complexity and size of leading-edge FPGAs has put a strain on traditional verification and debug methods used in FPGA design. GateRocket is exclusively focused on this crisis, providing a unique way to locate design errors, quickly correct them, and verify the entire design with an extremely fast solution.  These new enhancements streamline that process even more, allowing designers to focus on individual portions of their design and make sure they function properly, without having to go through the entire design cycle each time. This will have a dramatic impact on the design times, and improve the efficiency of finding bugs in very complex designs.

About GateRocket:  GateRocket, Inc., located in Bedford, Mass., offers electronic engineers the first Device Native® verification and debug solution for advanced FPGA semiconductor devices. The company’s RocketVision software debug tool and its RocketDrive hardware verification system enables users to verify and debug advanced FPGA designs faster and with higher quality for greatly improved time-to-market, and realize more reliable and predictable results. Learn more about GateRocket online atwww.gaterocket.com and sign up for a free webinar.

Comments

  1. … [Trackback]

    […] Read More: eejournal.com/industry_news/20100208-02/ […]

  2. … [Trackback]

    […] Find More Informations here: eejournal.com/industry_news/20100208-02/ […]

  3. … [Trackback]

    […] Find More on|Find More|Find More Infos here|Here you can find 42833 more Infos|Infos to that Topic: eejournal.com/industry_news/20100208-02/ […]

  4. … [Trackback]

    […] Read More on|Read More|Find More Infos here|Here you will find 86889 additional Infos|Infos on that Topic: eejournal.com/industry_news/20100208-02/ […]

  5. … [Trackback]

    […] Read More here|Read More|Find More Informations here|Here you can find 1584 more Informations|Infos to that Topic: eejournal.com/industry_news/20100208-02/ […]

  6. … [Trackback]

    […] Read More on|Read More|Find More Informations here|Here you will find 16447 more Informations|Informations to that Topic: eejournal.com/industry_news/20100208-02/ […]

  7. … [Trackback]

    […] Read More here|Read More|Read More Informations here|Here you can find 68062 additional Informations|Informations on that Topic: eejournal.com/industry_news/20100208-02/ […]

  8. … [Trackback]

    […] Read More on|Read More|Find More Informations here|Here you can find 7208 additional Informations|Infos to that Topic: eejournal.com/industry_news/20100208-02/ […]

  9. … [Trackback]

    […] Find More here|Find More|Find More Informations here|There you can find 9149 more Informations|Informations to that Topic: eejournal.com/industry_news/20100208-02/ […]

Leave a Reply