News – Page 1034 – EEJournal

Newark element14 Adds New High-Performance Solutions to Test & Tool Product Range

Chicago, September 17, 2018: Newark element14, the Development Distributor, has added a new wave of innovative tools to their test & tool product range, including solutions…

September 20, 2018

Rohde & Schwarz to present world’s first Bluetooth® LE signaling test solution at Bluetooth World 2018

Many manufacturers of Bluetooth® Low Energy components find it challenging to test modules and sensors in compliance with the standard. These devices often have no…

September 20, 2018

IAR Systems enables high-quality automotive applications with major updates in Renesas RH850 tools

Uppsala, Sweden – September 19, 2018 – IAR Systems®, the future-proof supplier of software tools and services for embedded development, presents a major update of…

September 20, 2018

eSilicon to demonstrate silicon performance of its 7nm 56G long-reach SerDes at ECOC, September 24-26, 2018

San Jose, Calif. eSilicon, a leading provider of FinFET-class ASICs, market-specific IP platforms and advanced 2.5D packaging solutions, will demonstrate the silicon performance of its…

September 20, 2018

ASSET’s fast test and programming tools for NXP i.MX6 application processors accelerate design and production

In development, ScanWorks automates complex DDR tuning to optimize memory performance – In manufacturing, faster flash programming with ScanWorks enhances throughput – In repair, ScanWorks’…

September 20, 2018

Cadence Launches New Tensilica DNA 100 Processor IP Delivering Industry-Leading Performance and Power Efficiency for On-Device AI Applications

SAN JOSE, Calif., September 19, 2018—Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced the Cadence® Tensilica® DNA 100 Processor IP, the first deep neural-network accelerator…

September 20, 2018

EM Microelectronic enables easy deployment of smart logistics and location services with a new generation of Bluetooth beacons

Marin, Switzerland, 17 September 2018 – EM Microelectronic, the ultra-low-power semiconductor company of the Swatch Group and a leading technology provider for connected objects, today…

September 19, 2018

Archives: News

Newark element14 Adds New High-Performance Solutions to Test & Tool Product Range

Rohde & Schwarz to present world’s first Bluetooth® LE signaling test solution at Bluetooth World 2018

IAR Systems enables high-quality automotive applications with major updates in Renesas RH850 tools

eSilicon to demonstrate silicon performance of its 7nm 56G long-reach SerDes at ECOC, September 24-26, 2018

ASSET’s fast test and programming tools for NXP i.MX6 application processors accelerate design and production

Cadence Launches New Tensilica DNA 100 Processor IP Delivering Industry-Leading Performance and Power Efficiency for On-Device AI Applications

Cadence Achieves Amazon Web Services Industrial Software Competency Status for Its Cloud-Hosted Design Solution

Rohde & Schwarz presents solutions for optimizing power electronics

GOWIN Semiconductor Unveils the Latest Embedded Memory Products for Their Families of Programmable Logic Devices

EM Microelectronic enables easy deployment of smart logistics and location services with a new generation of Bluetooth beacons