Archives: News
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Newark element14 announces Fluke T6-600 and T6-1000 Electrical Tester with fast, safe and reliable non-contact voltage measurements
Chicago, Illinois – 5th December 2017: The Fluke T6-600 and T6-1000 Electrical Testers, use a novel non-contact voltage sensing technique for fast, safe and reliable voltage measurements, are…
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Datalight Announces Failsafe File System Availability for Green Hills High Assurance INTEGRITY Operating System
BOTHELL, Wash., SANTA BARBARA, CA– December 5, 2017 – Green Hills Software, the worldwide leader in high assurance operating systems, and Datalight Inc., the leading developer…
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Leti Breakthroughs Point Way to Significant Improvements in SoC Memories
SAN FRANCISCO – Dec. 6, 2017 – Leti, a research institute of CEA Tech, demonstrated significant improvements in the field of memory systems at IEDM 2017 today.…
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Imec Demonstrates Power-Performance-Area-Cost Benefit of Heterogeneous Sequential-3D Integration for Advanced CMOS Nodes
LEUVEN, Belgium—Dec. 4, 2017 – At this week’s 2017 International Electron Devices Meeting (IEDM), imec, the world-leading research and innovation hub in nano-electronics and digital technology,…
