Archives: News
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Ultratech Cambridge Nanotech Enter Into JDP With IMEC To Study Area-Selective Deposition Technology
SAN JOSE, Calif., June 8, 2016 /PRNewswire/ — Ultratech, Inc. (Nasdaq: UTEK), a leading supplier of lithography, laser processing and inspection systems used to manufacture semiconductor devices and high-brightness…
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SMIC and Synopsys Deliver 28-nm HKMG Low-Power Reference Flow
MOUNTAIN VIEW, Calif. and SHANGHAI, June 8, 2016 /PRNewswire/ — Highlights: Technology advancements in the latest release of IC Compiler II deliver exceptional quality-of-results across all key metrics: Better…
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Mentor Graphics Offers Tanner Calibre One Verification Suite for the Tanner Analog/Mixed-Signal IC Design Environment
WILSONVILLE, Ore., June 06, 2016 — Mentor Graphics® Corporation (NASDAQ: MENT) today announced the Tanner Calibre One IC verification suite as an integral part of…
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NXP Selects Synopsys As Primary SoC Verification Solution
MOUNTAIN VIEW, Calif., June 6, 2016 /PRNewswire/ — Synopsys, Inc. (NASDAQ: SNPS) today announced that it was selected by NXP Semiconductor as its primary system-on-chip (SoC) verification solution…
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Coventor Announces SEMulator3D 6.0 and New Electrical Analysis Capabilities
CARY, NC– June 6, 2016 – Coventor®, Inc., the leading supplier of automated software solutions for semiconductor devices and micro-electromechanical systems (MEMS), today announced the…