Archives: News
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HUBER+SUHNER unveil innovative new range of high speed radio frequency test components and VNA test leads at DesignCon 2016
At DesignCon 2016 in Santa Clara, California, leading manufacturer of Global connectivity solutions, HUBER + SUHNER, will unveil innovative new additions to their radio frequency…
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Plessey to build LEDs in cubic GaN on Anvil Semiconductors’ 3C-SiC/Si substrates to overcome The Green Gap
PLYMOUTH, ENGLAND – 18th January 2016Â –Â Plessey, Anvil Semiconductors and the University of Cambridge announced today that they are working together to fabricate high efficiency LEDs…
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Keysight Technologies Expands its M8000 Series of BER Test Solutions for Multi-Channel Applications
Highlights: 10-channel BERT up to 16 Gb/s, with any combination of pattern generator or analyzer channel for maximum flexibility Each generator channel’s delay, jitter, de-emphasis,…
