Archives: News
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Keysight Technologies Unveils WaferPro Express 2015 Software Platform for Wafer-Level Device Characterization
SANTA ROSA, Calif., April 28, 2015 – Keysight Technologies, Inc. (NYSE: KEYS) today unveiled WaferPro Express 2015, a measurement software platform for the automated characterization of…
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PLS’ Universal Debug Engine 4.4.3 simplifies testing and debugging highly complex Xilinx Zynq-7000 SoC devices
Lauta (Germany), April 29, 2015 – PLS Programmierbare Logik & Systeme presents Version 4.4.3 of its Universal Debug Engine (UDE), which provides an optimized testing and debugging…
