Archives: News
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VIA Technologies Cuts Silicon Test Time by 11X Using Synopsys’ DFTMAX Ultra
MOUNTAIN VIEW, Calif., Oct. 20, 2014 /PRNewswire/ — Highlights: DFTMAXâ„¢ Ultra compression technology deliver 11X higher compression and reduced test time Higher test quality with shorter test time…
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Keysight Technologies Introduces CAN FD and SENT Triggering and Decode Options for InfiniiVision Oscilloscopes
SANTA ROSA, Calif., Oct. 20, 2014 – Keysight Technologies, Inc. today introduced CAN FD (controller area network with flexible data-rate) and SENT (single-edge nibble transmission) decoding and triggering…
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Synopsys Introduces Industry’s First On-Chip Memory Test and Repair Solution for Embedded Flash
MOUNTAIN VIEW, Calif., Oct. 20, 2014 /PRNewswire/ — Highlights: Extends the award-winning DesignWare STAR Memory System to support embedded flash memories Provides comprehensive test coverage and in-field…
