Archives: News
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KLA-Tencor Introduces Key Systems for 5Dâ„¢ Patterning Control Solution
MILPITAS, Calif., August 26, 2014—Today, KLA-Tencor Corporation (NASDAQ: KLAC) introduced the WaferSightâ„¢ PWG patterned wafer geometry measurement system, the LMS IPRO6 reticle pattern placement metrology system and the…
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Synopsys Announces Results of Robert S. Hilbert Memorial Optical Design Competition
MOUNTAIN VIEW, Calif., Aug. 25, 2014 /PRNewswire/ — Synopsys, Inc., a global leader providing software, IP and services used to accelerate innovation in chips and electronic systems, today…
