Archives: News
-
KLA-TENCOR Launches ICOS® WI-2280 Wafer Inspector For LED And Adjacent Markets
MILPITAS, Calif. (Dec. 4, 2012)—KLA-Tencor Corporation (NASDAQ: KLAC) today announced its next-generation light-emitting diode (LED) patterned wafer inspection tool, the ICOS WI-2280. Designed specifically for defect…
-
Handheld Tektronix Spectrum Analyzers Use DPX to Track Elusive Signals in the Field
BEAVERTON, Ore.,  Dec. 4, 2012 – Tektronix, Inc., a leading innovator of signal generation and analysis solutions required for the microwave and RF industry, today…
-
MetaEdit+ 5.0 integrates rich graphical DSLs with Eclipse and Visual Studio
Jyvaskyla, Finland—December 4, 2012—MetaCase (www.metacase.com), the leading provider of Domain-Specific Modeling (DSM) tools, has announced the release of a new, feature rich version of their…
-
Kilopass First to Demonstrate Antifuse Non-Volatile Memory IP With Successful Test Chips on TSMC 20nm Process
Santa Clara, Calif. — December 4, 2012 — Kilopass Technology Inc. (www.kilopass.com), a leading provider of semiconductor logic non-volatile memory (NVM) intellectual property (IP), today announced that its…
