Archives: News
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UMC Qualifies Synopsys’ IC Validator for 28-nm Physical Verification
MOUNTAIN VIEW, Calif., Oct. 22, 2012 /PRNewswire/ — Highlights: IC Validator brings In-Design physical verification to designers working at UMC’s 28nm node In-Design physical verification…
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Agilent Technologies to Demonstrate Newest Microwave and RF Design and Test Solutions at European Microwave Week
SANTA CLARA, Calif., Oct. 17, 2012 – Agilent Technologies Inc. (NYSE: A) today announced it will show its newest microwave and RF design, test and measurement solutions…
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Saelig Debuts New Low-cost High Power USB Inspection Microscope/Magnifier
Pittsford, NY, USA: Saelig Company, Inc. announces the MV600UM2 USB Inspection Microscope – an easy-to-use color digital microscope with a USB interface and magnification up…
