Archives: News
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Synopsys and Samsung Deliver a Complete Solution for 20-Nanometer Node
MOUNTAIN VIEW, Calif., June 4, 2012 /PRNewswire/ — Synopsys, Inc. (Nasdaq:SNPS), a world leader in software and IP used in the design, verification and manufacture of…
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ams’ analog/mixed-signal foundry extends its customized IC test solution service
Unterpremstaetten, Austria (June 5, 2012), The Full Service Foundry business unit of ams (SIX: AMS) today announced an extension of its dedicated test solutions for…
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Samsung and Cadence Deliver 20nm Digital Design Methodology
DAC Booth # 1930 — Cadence Design Systems, Inc. (NASDAQ: CDNS), a leader in global electronic design innovation, today announced that Samsung Electronics and Cadence have…
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IPL Alliance Announces IPL 2.0 and Appoints New Chair for Constraint Working Group
MOUNTAN VIEW, Calif., June 4, 2012 /PRNewswire/ — The Interoperable PDK Libraries (IPL) Alliance today announced IPL 2.0, an updated release of the semiconductor industry’s first…
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Chip Path Design Systems Announces System-on-Chip Architectural Assembly and Floorplanning System
DESIGN AUTOMATION CONFERENCE, San Francisco, Calif. – June 4, 2012 –– Chip Path Design Systems, the system-on-chip assembly company, today announced that it will be showing…
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Cadence Physical Verification System Qualified for TSMC 28nm, 20nm Process
SAN FRANCISCO, CA–(Marketwire – June 04, 2012) – DAC Booth # 1930 — Cadence Design Systems, Inc. (NASDAQ: CDNS), a leader in global electronic design innovation, today announced…
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Atrenta Introduces Fast Lint for SpyGlass®
SAN FRANCISCO, Calif — June 4, 2012 — Atrenta Inc., a leading provider of SoC Realization solutions for the semiconductor and electronic systems industries, announced today at the 49thDesign Automation…