Archives: News
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Rohde & Schwarz announces on-wafer device characterization test solution
Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network…
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Keysight Technologies Announces Student Finalists for Innovation Challenge
SANTA ROSA, Calif. July 18, 2022 Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate…
