Single-event effects (SEE) during operation of power regulators can cause the output of the regulator to be as high as the regulator input for short durations, on order of tenths of microseconds. Consequently, any device that is powered by the regulator could see this supply glitch during normal operation of the device. This report summarizes the experiments and data collected to study the impact of these power supply glitches on the RTAX™-S and RTSX-SU devices on printed circuit boards.
Power Supply Transients on RTAX-S and RTSX-SU Devices
Comments
More Articles
-
Sticking With their Story: Zeno Demonstrates 1T SRAM at Leading Nodes
Let’s face it: We’re addicted to SRAM. It’s big, it’s power-hungry, but it’s fast. And no matter how much we…
-
Bill Godbout Perishes in Northern California’s Camp Fire
People of a certain age, who mindfully lived through the early microcomputer revolution during the first half of the…
-
Costs for Sub-20nm Wafers put Another Nail in Moore’s Law’s Coffin
IC Insights has just published the September Update to The 2018 McClean Report, and one figure (reproduced below) puts…

Leave a Reply
You must be logged in to post a comment.