Archives: News
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Circuit Check and ASSET InterTech collaborate on boundary-scan test solutions
News Highlights Combined products allow the capability to support printed circuit board assembly or product-level test and programming. CCI’s unique quick-change fixture drop-in technologies allow…
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Imec and EVG demonstrate for the first time 1.8µm pitch overlay accuracy for wafer bonding
Leuven (Belgium)—Jan. 19, 2017— At the 2017 European 3D Summit in Grenoble (France, Jan 23-25), the world-leading research and innovation hub for nano-electronics and digital technology…
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Synopsys Releases New Version of Coverity Static Analysis Tool with Enhanced Security for Mobile and Web Applications
Highlights: Enhances Android security analysis to detect critical vulnerabilities and weaknesses on the OWASP Top 10 Improves security analysis and accuracy for JavaScript, Java and…
