News – Page 1346 – EEJournal

SiFive Introduces Industry’s First Open-Source Chip Platforms

SAN FRANCISCO – July 11, 2016 – SiFive, the first fabless semiconductor company to build customized, open-source enabled semiconductors, today announced its flagship Freedom family of…

July 11, 2016

Mentor Graphics Extends the PADS PCB Product Creation Platform with Advanced Analog/Mixed-Signal and High Speed Analysis for Mainstream Engineers

WILSONVILLE, Ore., July 11, 2016 — Mentor Graphics Corporation (NASDAQ: MENT) today announced the latest additions to the PADS® PCB Product Creation Platform. New analog/mixed-signal…

July 11, 2016

Intersil Announces Industry’s First Rad Tolerant 36V Instrumentation Amplifier with Integrated Differential ADC Driver

Milpitas, Calif., July 11, 2016 – Intersil Corporation (NASDAQ: ISIL), a leading provider of innovative power management and precision analog solutions, today introduced the industry’s first radiation…

July 11, 2016

Synopsys Releases Coverity 8.5 Static Analysis Tool

MOUNTAIN VIEW, Calif., July 11, 2016 /PRNewswire/ — Highlights: Introduces Coverity static analysis capabilities for Ruby and node.js web applications, as well as Android mobile applications…

July 11, 2016

Imec and ARM collaborate on Design-Technology Co-Optimization for 7nm technology and beyond

Leuven (Belgium) and Cambridge (UK) – July 11, 2016 – World-leading nanoelectronics research center imec has signed a strategic partnership with ARM, the company whose…

July 11, 2016

Applied Materials’ Next-Generation E-Beam Inspection System Provides Industry’s Highest Resolution

New PROVision™ system is the only e-beam inspection tool with 1nm resolution; critical for R&D, ramp and production control of ?10nm multiple patterning, FinFET formation,…

July 11, 2016

KLA-Tencor Introduces Comprehensive Wafer Inspection and Review Portfolio for Leading IC Technologies

SAN FRANCISCO, July 11, 2016 /PRNewswire/ — In advance of SEMICON West, KLA-Tencor Corporation (NASDAQ: KLAC) today introduced six advanced wafer defect inspection and review systems for leading-edge IC device…

July 11, 2016

Percepio Launches Tracealyzer for Micrium’s µC/OS-III with Streaming Trace

Västerås, Sweden, 7th July 2016 – Percepio AB, the Swedish developer of RTOS visualization tools, today announced the launch of Tracealyzer for Micrium’s µC/OS-III® with…

July 8, 2016

RS Components first to market with NFC timing relays from Schneider Electric

OXFORD, UK, 8th July, 2016 – RS Components (RS), the trading brand of Electrocomponents plc (LSE:ECM), the global distributor for engineers, has announced that it is the…

July 8, 2016

Micron Introduces Industry’s Best-in-Class SLC NAND Flash for IoT and Automotive

BOISE, Idaho, July 07, 2016 (GLOBE NEWSWIRE) — Micron Technology, Inc. (NASDAQ:MU), today announced its newest embedded SLC NAND Flash optimized for the next generation of Internet of Things (IoT) and automotive…

July 8, 2016

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